Optimal periodic testing policy for circuit with self-testing

DOI10.1016/J.CAMWA.2005.11.025MaRDI QIDQ2494804zbMATH OpenOpenAlexFDO

Authors Satoshi Mizutani, Toshio Nakagawa, Kodo Ito, Hiroaki Sandoh

Publication date 30 June 2006

Published in Computers & Mathematics with Applications (Search for Journal in Brave)

Full work available at URL https://doi.org/10.1016/j.camwa.2005.11.025

Mathematics Subject Classification ID

Fault detection; testing in circuits and networks (94C12)

Recommendations

• Optimal testing-policies for intermittent faults
• Extended inspection models
• A simple fault-diagnosis system with periodic testing
• Optimal testing policy for a computer system with fault margin
• scientific article; zbMATH DE number 4043584

Cites work

• scientific article; zbMATH DE number 3215084 (Why is no real title available?)
• On Random Pattern Test Length
• Probabilistic Treatment of General Combinational Networks
• Random Pattern Testability
• The Error Latency of a Fault in a Sequential Digital Circuit

Cited in

(5)

• A maintenance policy for a parallel system with cascading failure
• A simple fault-diagnosis system with periodic testing
• Optimal testing policy for a computer system with fault margin
• Optimal testing-policies for intermittent faults
• scientific article; zbMATH DE number 4166416 (Why is no real title available?)

This page was built for publication: Optimal periodic testing policy for circuit with self-testing

Report a bug (only for logged in users!)Click here to report a bug for this page (MaRDI item Q2494804)