On Random Pattern Test Length

DOI10.1109/TC.1984.1676470MaRDI QIDQ3321982zbMATH OpenOpenAlexFDO

Authors Jacob Savir, Paul H. Bardell

Publication date 1984

Published in IEEE Transactions on Computers (Search for Journal in Brave)

Full work available at URL https://doi.org/10.1109/tc.1984.1676470

zbMATH Keywords

fault detectionself-testnonmasking multiple faultstesting of large logic networks with random patterns

Mathematics Subject Classification ID

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• GLOBAL: A design for random testability algorithm
• Pseudo-random test generation for large combinational circuits
• Confidence intervals for expected coverage from a beta testability model
• Address Sequences and Backgrounds with Different Hamming Distances for Multiple Run March Tests

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