Fault coverage and test length estimation for random pattern testing
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Recommendations
Cited in
(9)- On evaluating and optimizing weights for weighted random pattern testing
- On the effect of defect clustering on test transparency and IC test optimization
- On Random Pattern Test Length
- Generic Fault Characterizations for Table Look-Up Coverage Bounding
- scientific article; zbMATH DE number 176529 (Why is no real title available?)
- Improved analogue fault coverage estimation using probabilistic analysis
- Coverage estimation methods for stratified fault-injection
- Confidence intervals for expected coverage from a beta testability model
- Estimators for fault tolerance coverage evaluation
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