Optimization of manufacturing of emitter-coupled logic to decrease surface of chip
From MaRDI portal
Recommendations
- scientific article; zbMATH DE number 750121
- Fast Optimal Design of Semiconductor Devices
- Chips on wafers (extended abstract)
- System reduction for nanoscale IC design
- A novel approach to hedge and compensate the critical dimension variation of the developed-and-etched circuit patterns for yield enhancement in semiconductor manufacturing
- Manufacturability aware routing in nanometer VLSI
Cites work
This page was built for publication: Optimization of manufacturing of emitter-coupled logic to decrease surface of chip
Report a bug (only for logged in users!)Click here to report a bug for this page (MaRDI item Q5249436)