Bayesian analysis of data with only one failure

DOI10.1007/BF02662883zbMATH Open0865.62072MaRDI QIDQ1349299FDOQ1349299

Authors: Shisong Mao, Jun Chen 

Publication date: 4 February 1997

Published in: Applied Mathematics. Series B (English Edition) (Search for Journal in Brave)

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zbMATH Keywords

reliabilityrobustnessWeibull distributionBayesian estimatesprior distributionhierarchical Bayesian methodsmethod of least squareshierarchical prior

Mathematics Subject Classification ID

Bayesian inference (62F15) Reliability and life testing (62N05)

Cites Work

• Statistical decision theory and Bayesian analysis. 2nd ed
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Cited In (5)

• The Bayesian approach for highly reliable electro-explosive devices using one-shot device testing
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• Lifelong dedication and ever-admirable stature – in commemoration of the first anniversary of Mr. Mao Shisong’s passing
• Reliability assessment for very few failure data and Weibull distribution
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