Exploiting deterministic TPG for path delay testing

DOI10.1007/BF02950411zbMATH Open0961.68114OpenAlexW2061983402MaRDI QIDQ1587342FDOQ1587342

Authors: Paul Y. S. Cheung, Xiaowei Li 

Publication date: 20 November 2000

Published in: Journal of Computer Science and Technology (Search for Journal in Brave)

Full work available at URL: https://doi.org/10.1007/bf02950411

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zbMATH Keywords

linear feedback shift registertest pattern generatorpath delay faults

Mathematics Subject Classification ID

Pattern recognition, speech recognition (68T10)

Cites Work

• BIST test pattern generators for two-pattern testing-theory and design algorithms

Cited In (3)

• A loop-based apparatus for at-speed self-testing
• Title not available (Why is that?)
• BIST test pattern generators for two-pattern testing-theory and design algorithms

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