Application of extension neural network type-1 to fault diagnosis of electronic circuits

DOI10.1155/2012/352749MaRDI QIDQ1954697zbMATH OpenOpenAlexWikidataFDO

Authors Meng-Hui Wang

Publication date 11 June 2013

Published in Mathematical Problems in Engineering (Search for Journal in Brave)

Full work available at URL https://doi.org/10.1155/2012/352749

Mathematics Subject Classification ID

Analytic circuit theory (94C05) Fault detection; testing in circuits and networks (94C12)

Review text

Summary: The values of electronic components are always deviated, but the functions of the modern circuits are more and more precise, which makes the automatic fault diagnosis of analog circuits very complex and difficult. This paper presents an extension-neural-network-type-1-(ENN-1-)based method for fault diagnosis of analog circuits. This proposed method combines the extension theory and neural networks to create a novel neural network. Using the matter-element models of fault types and a correlation function, can be calculated the correlation degree between the tested pattern and every fault type; then, the cause of the circuit malfunction can be directly diagnosed by the analysis of the correlation degree. The experimental results show that the proposed method has a high diagnostic accuracy and is more fault tolerant than the multilayer neural network (MNN) and the k-means based methods.

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Cites work

• Hierarchical fault diagnosis of analog integrated circuits

Cited in

(4)

• Application of feed-forward artificial neural networks to the identification of defective analog integrated circuits
• Improved extension neural network and its applications
• Fault diagnosis of analog circuits based on PSO-WNN
• scientific article; zbMATH DE number 2089785 (Why is no real title available?)

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