A Lagrangian approach for quantum-mechanical electrostatic analysis of deformable silicon nanostructures

DOI10.1016/J.ENGANABOUND.2006.03.012MaRDI QIDQ1958243zbMATH OpenOpenAlexFDO

Authors Gang Li, N. R. Aluru

Publication date 28 September 2010

Published in Engineering Analysis with Boundary Elements (Search for Journal in Brave)

Full work available at URL https://doi.org/10.1016/j.enganabound.2006.03.012

zbMATH Keywords

Lagrangian electrostaticsnanoelectromechanical systems (NEMS)quantum-mechanical electrostatic analysis

Mathematics Subject Classification ID

Electromagnetic effects in solid mechanics (74F15) Boundary element methods applied to problems in solid mechanics (74S15) Electro- and magnetostatics (78A30) Closed and approximate solutions to the Schrödinger, Dirac, Klein-Gordon and other equations of quantum mechanics (81Q05)

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Cited in

(4)

• Pull-in instability of cantilever and fixed-fixed nano-switches
• Numerical analysis of 3D electrostatics of deformable conductors using a Lagrangian approach
• A continuum-based modeling of MEMS devices for estimating their resonant frequencies
• Modeling and simulation of electronic structure, material interface and random doping in nano-electronic devices

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