Estimation of the lowest limit of 1/f noise in semiconductor materials
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Estimation of the lowest limit of \(1/f\) noise in semiconductor materials
Estimation of the lowest limit of \(1/f\) noise in semiconductor materials
Abstract: A lowest limit of 1/f noise in semiconductor materials has not yet been reported; we do not even know if such a lowest limit exists. 1/f noise in semiconductors has recently been brought into relation with 1/f noise in quantum dots and other materials. These materials exhibit on-off states which are power-law distributed over a wide range of timescales. We transfer such findings to semiconductors, assuming that the g-r process is also controlled by such on-off states. As a result, we obtain 1/f noise which can be expressed in the form of the Hooge relation. Based on the intermittent g-r process, we estimate the lowest limit of 1/f noise in semiconductor materials. We show that this limit is inversely proportional to the dopant concentration; to detect the lowest limit of 1/f noise, the number of centers should be as small as possible. We also find a smooth dependence of 1/f noise and g-r noise on time.
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Cites work
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Cited in
(7)- Corrigendum to: ``The transition from generation-recombination noise in bulk semiconductors to discrete switching in small-area semiconductors
- 1/f noise under drift and thermal agitation in semiconductor materials
- A quantum bound on the \(1/f\) noise in semiconductors with a conical energy-momentum dispersion
- An alternative form of Hooge's relation for 1/f noise in semiconductor materials
- Analysis of 1/f noise in switched MOSFET circuits
- \(1/f\) noises of homopolar and heteropolar semiconductors
- The transition from generation-recombination noise in bulk semiconductors to discrete switching in small-area semiconductors
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