Estimation of the lowest limit of 1/f noise in semiconductor materials

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Publication:2212911

DOI10.1016/J.PHYSLETA.2019.126145zbMATH Open1448.82047arXiv2108.07688OpenAlexW2991381788MaRDI QIDQ2212911FDOQ2212911


Authors: Ferdinand Grüneis Edit this on Wikidata


Publication date: 27 November 2020

Published in: Physics Letters. A (Search for Journal in Brave)

Abstract: A lowest limit of 1/f noise in semiconductor materials has not yet been reported; we do not even know if such a lowest limit exists. 1/f noise in semiconductors has recently been brought into relation with 1/f noise in quantum dots and other materials. These materials exhibit on-off states which are power-law distributed over a wide range of timescales. We transfer such findings to semiconductors, assuming that the g-r process is also controlled by such on-off states. As a result, we obtain 1/f noise which can be expressed in the form of the Hooge relation. Based on the intermittent g-r process, we estimate the lowest limit of 1/f noise in semiconductor materials. We show that this limit is inversely proportional to the dopant concentration; to detect the lowest limit of 1/f noise, the number of centers should be as small as possible. We also find a smooth dependence of 1/f noise and g-r noise on time.


Full work available at URL: https://arxiv.org/abs/2108.07688




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