An alternative form of Hooge's relation for 1/f noise in semiconductor materials

From MaRDI portal
Publication:820577

DOI10.1016/J.PHYSLETA.2019.02.009zbMATH Open1471.82029arXiv2108.07155OpenAlexW2912213330MaRDI QIDQ820577FDOQ820577


Authors: Ferdinand Grüneis Edit this on Wikidata


Publication date: 27 September 2021

Published in: Physics Letters. A (Search for Journal in Brave)

Abstract: Single quantum dots and other materials exhibit irregular switching between on and off states; these on-off states follow power-law statistics giving rise to 1/f noise. We transfer this phenomenon (also referred to as on-off intermittency) to the generation and recombination (g-r) process in semiconductor materials. In addition to g-r noise we obtain 1/f noise that can be provided in the form of the Hooge relation. The predicted Hooge coefficient depends on the parameters of the g-r noise and on the parameters of the intermittency. Due to the power-law distribution of the on-times, the coefficient for intermittency shows a smooth dependence on time t. We also suggest an alternative form of the 1/f noise formula by Hooge relating the 1/f noise to the number of centers (such as donor or trap atoms) rather than to the number of charge carriers as defined by Hooge.


Full work available at URL: https://arxiv.org/abs/2108.07155




Recommendations




Cites Work


Cited In (6)





This page was built for publication: An alternative form of Hooge's relation for 1/f noise in semiconductor materials

Report a bug (only for logged in users!)Click here to report a bug for this page (MaRDI item Q820577)