Sensitivity, probabilistic and stochastic analysis of the thermo-piezoelectric phenomena in solids by the stochastic perturbation technique

DOI10.1007/S11012-011-9458-5MaRDI QIDQ2443553zbMATH OpenOpenAlexFDO

Authors Alberto Corigliano, Marcin Kamiński

Publication date 8 April 2014

Published in Meccanica (Search for Journal in Brave)

Copyright license Creative Commons Attribution-NonCommercial 4.0 International

Full work available at URL https://doi.org/10.1007/s11012-011-9458-5

zbMATH Keywords

coupled field problemsMEMS devicesMonte-Carlo simulationreliability analysisstochastic perturbation methodthermo-piezoelectricity

Mathematics Subject Classification ID

Thermal effects in solid mechanics (74F05) Electromagnetic effects in solid mechanics (74F15) Analytic approximation of solutions (perturbation methods, asymptotic methods, series, etc.) of dynamical problems in solid mechanics (74H10) Finite element methods applied to problems in solid mechanics (74S05) Stochastic and other probabilistic methods applied to problems in solid mechanics (74S60)

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Cites work

• A three-scale FE approach to reliability analysis of MEMS sensors subject to impacts
• An exact solution for the three-phase thermo-electro-magneto-elastic cylinder model and its application to piezoelectric-magnetic fiber composites
• Electromagneto-thermo-mechanical behaviors of conductive circular plate subject to time-dependent magnetic fields
• scientific article; zbMATH DE number 3515058 (Why is no real title available?)
• scientific article; zbMATH DE number 627771 (Why is no real title available?)
• On the constitutive relations and energy potentials of linear thermo-magneto-electro-elasticity
• Solid damping in micro electro mechanical systems
• Uniqueness and Reciprocity Theorems for Linear Thermo-Electro-Magneto-Elasticity

Cited in

(5)

• The effect of uncertain material properties on free vibrations of thin periodic plates
• Reliability for design of planetary gear drive units
• Static analysis of multilayered smart shells subjected to mechanical, thermal and electrical loads
• Investigation on a nanomechanical transistor
• Numerical solution of the Duffing equation with random coefficients

Describes a project that uses

Uses Software

• Maple

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