An approximation of semiconductor device by mixed finite element method and characteristics-mixed finite element method
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Publication:275764
DOI10.1016/j.amc.2013.09.067zbMath1334.78043MaRDI QIDQ275764
Publication date: 26 April 2016
Published in: Applied Mathematics and Computation (Search for Journal in Brave)
Full work available at URL: https://doi.org/10.1016/j.amc.2013.09.067
error estimates; mixed finite element method; characteristics-mixed finite element method; post-processing step; semiconductor device
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