Symmetric -charts: Sensitivity to nonnormality and control-limit estimation
From MaRDI portal
Publication:2965577
DOI10.1080/03610918.2014.963615zbMath1359.62532OpenAlexW2419512291MaRDI QIDQ2965577
Huifen Chen, Kwok-Leung Tsui, David Goldsman, Bruce W. Schmeiser
Publication date: 3 March 2017
Published in: Communications in Statistics - Simulation and Computation (Search for Journal in Brave)
Full work available at URL: https://doi.org/10.1080/03610918.2014.963615
Cites Work
- Unnamed Item
- Unnamed Item
- Unnamed Item
- Unnamed Item
- Non-normality effects on the economic-statistical design of \(\bar X\) charts with Weibull in-control time
- Run length distributions and economic design of \(\overline{X}\) charts with unknown process variance
- An Improved Estimator of σ in Quality Control
- Statistical Methods for Quality Improvement
- On similarity and independence properties of composite edf goodness-of-fit tests
- The Completeness and Uniqueness of Johnson's System in Skewness–Kurtosis Space
- Robustness of mean E(X) and R charts
- Shewhart x-charts with estimated process variance
- Run length, average run length and false alarm rate of shewhart x-bar chart: exact derivations by conditioning
- Robustness to non-normality and autocorrelation of individuals control charts
- An approximate method for generating symmetric random variables
- Simplified Methods of Fitting Certain Types of Growth Curves
- SYSTEMS OF FREQUENCY CURVES GENERATED BY METHODS OF TRANSLATION
- Cumulative Frequency Functions
- An Inequality for Mill's Ratio
This page was built for publication: Symmetric -charts: Sensitivity to nonnormality and control-limit estimation
