Modified octree mesh generation for Manhattan type structures with narrow layers applied to semiconductor devices
DOI10.1002/JNM.623zbMATH Open1104.82050OpenAlexW2075518905MaRDI QIDQ3418211FDOQ3418211
Manuel Aldegunde, J. J. Pombo, A. J. García-Loureiro
Publication date: 2 February 2007
Published in: International Journal of Numerical Modelling: Electronic Networks, Devices and Fields (Search for Journal in Brave)
Full work available at URL: https://doi.org/10.1002/jnm.623
Recommendations
- scientific article; zbMATH DE number 1163559
- Automatic three-dimensional mesh generation by the modified-octree technique
- Tetrahedron-based octree encoding for automatic mesh generation
- OCTREE-BASED HEXAHEDRAL MESH GENERATION
- Octree-based reasonable-quality hexahedral mesh generation using a new set of refinement templates
- Impact of tetrahedralization on parallel conforming octree mesh generation
- Automatic three‐dimensional mesh generation by the finite octree technique
- scientific article; zbMATH DE number 582858
- Improving the quality of meshes for the simulation of semiconductor devices using Lepp‐based algorithms
Mesh generation, refinement, and adaptive methods for boundary value problems involving PDEs (65N50) Statistical mechanics of semiconductors (82D37)
Cited In (2)
Uses Software
This page was built for publication: Modified octree mesh generation for Manhattan type structures with narrow layers applied to semiconductor devices
Report a bug (only for logged in users!)Click here to report a bug for this page (MaRDI item Q3418211)