scientific article; zbMATH DE number 4170039
From MaRDI portal
Publication:3495602
diffusion problemserror boundfinite elementmoving boundarysemiconductortime independent triangulationVLSI device fabrication
PDEs in connection with optics and electromagnetic theory (35Q60) Free boundary problems for PDEs (35R35) Finite element, Rayleigh-Ritz and Galerkin methods for initial value and initial-boundary value problems involving PDEs (65M60) Applications to the sciences (65Z05) Diffusion (76R50) Technical applications of optics and electromagnetic theory (78A55)
Recommendations
- Finite element solution of a nonlinear diffusion problem with a moving boundary
- scientific article; zbMATH DE number 4047016
- Analysis of a finite element method for the drift-diffusion semiconductor device equations: The multidimensional case
- Projection finite element methods for semiconductor device equations
- scientific article; zbMATH DE number 67179
Cited in
(6)- AN EFFICIENT DIFFUSION ALGORITHM FOR 2‐D VLSI PROCESS MODELING CODE
- A finite difference method for modeling migration of impurities in multilayer systems
- Finite element solution of a nonlinear diffusion problem with a moving boundary
- scientific article; zbMATH DE number 4047016 (Why is no real title available?)
- scientific article; zbMATH DE number 4072321 (Why is no real title available?)
- scientific article; zbMATH DE number 67179 (Why is no real title available?)
This page was built for publication:
Report a bug (only for logged in users!)Click here to report a bug for this page (MaRDI item Q3495602)
