scientific article; zbMATH DE number 3900680

MaRDI QIDQ3679112zbMATH OpenFDO

Authors Weiwei Mao, Genghong Ruan

Publication date 1984

zbMATH Keywords

combinational circuitstest generation algorithmsix-valued logic systems

Mathematics Subject Classification ID

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Cited in

(1)

• Test pattern generation effort evaluation of reversible circuits

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