scientific article; zbMATH DE number 3900680

zbMATH Open0564.94016MaRDI QIDQ3679112FDOQ3679112

Authors: Weiwei Mao, Genghong Ruan 

Publication date: 1984

Title of this publication is not available (Why is that?)

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zbMATH Keywords

combinational circuitstest generation algorithmsix-valued logic systems

Mathematics Subject Classification ID

Cited In (1)

• Test pattern generation effort evaluation of reversible circuits

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