scientific article; zbMATH DE number 3987203
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Publication:3751514
zbMATH Open0609.94017MaRDI QIDQ3751514FDOQ3751514
Publication date: 1984
Title of this publication is not available (Why is that?)
Recommendations
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- Synthesizing testable combinational circuits
- A new class of sequential circuits with combinational test generation complexity
- Complete test generation method for all stuck-at faults in combinational circuits
- A New and Fast Approach to Very Large Scale Integrated Sequential Circuit Test Generation
Cited In (12)
- A new method to generate the complete set of unique signals for application in high consequence system
- Fast test generation for m-logic combinational circuits
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- An Algorithm to Generate Random Large Combinational Circuits
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- Complete test generation method for all stuck-at faults in combinational circuits
- Test generation for iterative logic arrays based on an N-cube of cell states model
- Logic complement, a new method of checking the combinational circuits
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- An algorithm to generate complete test sets for stuck-at faults in combinational logic circuits
- Complete test-set generation for bridging faults in combinational-logic circuits
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