On a Novel Self-test Approach to Digital Testing

DOI10.1093/COMJNL/30.3.258zbMATH Open0635.94026OpenAlexW2161269168MaRDI QIDQ3775484FDOQ3775484

Authors:

Publication date: 1987

Published in: The Computer Journal (Search for Journal in Brave)

Full work available at URL: https://doi.org/10.1093/comjnl/30.3.258

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zbMATH Keywords

digital systemdynamical modellingdigital testingiterative self-test approachsequential and combinational logicsingle and multiple fault decision and location

Mathematics Subject Classification ID

Cited In (3)

• Title not available (Why is that?)
• Verification Testing—A Pseudoexhaustive Test Technique
• Repairing VLSI/WSI redundant memories with minimum cost

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