Test Procedures for a Class of Pattern-Sensitive Faults in Semiconductor Random-Access Memories
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Publication:3877582
DOI10.1109/TC.1980.1675601zbMath0436.94043OpenAlexW1988411694MaRDI QIDQ3877582
Sudhakar M. Reddy, Dong S. Suk
Publication date: 1980
Published in: IEEE Transactions on Computers (Search for Journal in Brave)
Full work available at URL: https://doi.org/10.1109/tc.1980.1675601
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