scientific article; zbMATH DE number 35511

DOI10.1002/1520-6750(199204)39:3%3C369::AID-NAV3220390307%3E3.0.CO;2-FzbMATH Open0745.90042MaRDI QIDQ3989986FDOQ3989986

Louis A. Martin-Vega, Chung-Yee Lee, Reha Uzsoy

Publication date: 28 June 1992

Title of this publication is not available (Why is that?)

zbMATH Keywords

heuristicsmaximum latenesssingle-machine schedulingsequence-dependent setup timesworst-case error boundsemiconductor test operations

Mathematics Subject Classification ID

Deterministic scheduling theory in operations research (90B35)

Cites Work

• Title not available (Why is that?)

Cited In (17)

• A classification of dynamic programming formulations for offline deterministic single-machine scheduling problems
• Rolling horizon algorithms for a single-machine dynamic scheduling problem with sequence-dependent setup times
• Semiconductor final-test scheduling under setup operator constraints
• A branch-and-bound algorithm for three-machine flowshop scheduling problem to minimize total completion time with separate setup times
• A sequencing problem with family setup times
• Heuristics for capacity planning problems with congestion
• Single-machine scheduling with past-sequence-dependent setup times and learning effects: a parametric analysis
• In-house development of scheduling decision support systems: case study for scheduling semiconductor device test operations
• Minimizing makespan on parallel machines with release time and machine eligibility restrictions
• Scheduling semiconductor multihead testers using metaheuristic techniques embedded with lot-specific and configuration-specific information
• Scheduling algorithms for a semiconductor probing facility
• A modified shifting bottleneck heuristic for minimizing total weighted tardiness in complex job shops
• A beam search heuristic for scheduling a single machine with release dates and sequence dependent setup times to minimize the makespan
• Scheduling of multi-spindle CNC gantry mills
• Preemptive scheduling with release dates, delivery times and sequence independent setup times
• Single-machine scheduling problems with past-sequence-dependent setup times
• Scheduling of wafer test processes in semiconductor manufacturing

This page was built for publication:

Report a bug (only for logged in users!)Click here to report a bug for this page (MaRDI item Q3989986)