Scheduling of wafer test processes in semiconductor manufacturing
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- scientific article; zbMATH DE number 35511
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Cites work
- An interactive scheduler for a wafer probe centre in semiconductor manufacturing
- scientific article; zbMATH DE number 35511 (Why is no real title available?)
- Rolling horizon procedures for dynamic parallel machine scheduling with sequence-dependent setup times
- The Shifting Bottleneck Procedure for Job Shop Scheduling
- The wafer probing scheduling problem (WPSP)
Cited in
(16)- Determining the optimal probing lot size for the wafer probe operation in semiconductor manufacturing
- Job scheduling of diffusion furnaces in semiconductor fabrication facilities
- A survey of scheduling problems with setup times or costs
- A novel timetabling algorithm for a furnace process for semiconductor fabrication with constrained waiting and frequency-based setups
- Semiconductor final-test scheduling under setup operator constraints
- Evaluation of heuristics for a class-constrained lot-to-order matching problem in semiconductor manufacturing
- A new paradigm for rule-based scheduling in the wafer probe centre
- scientific article; zbMATH DE number 35511 (Why is no real title available?)
- Semiconductor final test scheduling with Sarsa\((\lambda , k)\) algorithm
- The wafer probing scheduling problem (WPSP)
- Scheduling semiconductor multihead testers using metaheuristic techniques embedded with lot-specific and configuration-specific information
- Scheduling of multiple in-line steppers for semiconductor wafer fabs
- Scheduling algorithms for a semiconductor probing facility
- A simulation optimization framework to solve stochastic flexible job-shop scheduling problems -- case: semiconductor manufacturing
- A multi-criteria approach for scheduling semiconductor wafer fabrication facilities
- Hybrid decomposition heuristics for solving large-scale scheduling problems in semiconductor wafer fabrication
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