scientific article; zbMATH DE number 527269

MaRDI QIDQ4284993zbMATH OpenFDO

Authors

Publication date 13 March 1994

zbMATH Keywords

BIC monitorCircuits and systemsdefect diagnosisElectronic testingreliabilitytest patterns

Mathematics Subject Classification ID

Proceedings, conferences, collections, etc. pertaining to computer science (68-06) Reliability, testing and fault tolerance of networks and computer systems (68M15) Computer system organization (68M99)

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