scientific article; zbMATH DE number 1775523

zbMATH Open1015.94554MaRDI QIDQ4544352FDOQ4544352

Martin Keim, Rolf Drechsler, Bernd Becker

Publication date: 4 August 2002

Title of this publication is not available (Why is that?)

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zbMATH Keywords

fault simulatorcellular fault modelmulti-valued logic networksrandom pattern testability

Mathematics Subject Classification ID

Fault detection; testing in circuits and networks (94C12)

Cited In (2)

• Fault simulation in multivalued alphabets
• Title not available (Why is that?)

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