scientific article; zbMATH DE number 1526144

zbMATH Open0956.94033MaRDI QIDQ4512925FDOQ4512925

Authors: Yeong-Jar Chang, Chung Len Lee, Jwu-E. Chen 

Publication date: 18 March 2001

Title of this publication is not available (Why is that?)

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zbMATH Keywords

logic faultsconstant variation faultliteral window shiftmulti-valued current mode CMOS circuitsstuck-at fault model

Mathematics Subject Classification ID

Fault detection; testing in circuits and networks (94C12)

Cited In (6)

• Fault security analysis of CMOS VLSI circuits using defect-injectable VHDL models
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• Quaternary regenerative CMOS logic circuits with high-impedance output state
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• Nonstuck behaviour of open circuit supply faults in CMOS logic circuits
• Testable Realizations for FET Stuck-Open Faults in CMOS Combinational Logic Circuits

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