scientific article; zbMATH DE number 1526144

MaRDI QIDQ4512925zbMATH OpenFDO

Authors Yeong-Jar Chang, Chung Len Lee, Jwu-E. Chen

Publication date 18 March 2001

zbMATH Keywords

logic faultsconstant variation faultliteral window shiftmulti-valued current mode CMOS circuitsstuck-at fault model

Mathematics Subject Classification ID

Fault detection; testing in circuits and networks (94C12)

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