The development of technology-independent metrics for evaluation of the masking properties of logic

zbMATH Open1403.94131MaRDI QIDQ4594422FDOQ4594422

Authors: Alexander Leonidovich Stempkovskiǐ, D. V. Tel'pukhov, Roman Alexandrovich Solov'Ev, Mikhail Viktorovich Myachikov, Natalya Vladimirovna Telpukhova 

Publication date: 23 November 2017

Full work available at URL: http://www.ict.nsc.ru/jct/annotation/1723?l=eng

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zbMATH Keywords

fault-tolerancecombinational circuitsensitivity factorgate observability

Mathematics Subject Classification ID

Analytic circuit theory (94C05)

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