The development of technology-independent metrics for evaluation of the masking properties of logic

MaRDI QIDQ4594422zbMATH OpenFDO

Authors Alexander Leonidovich Stempkovskiǐ, D. V. Tel'pukhov, Roman Alexandrovich Solov'Ev, Mikhail Viktorovich Myachikov, Natalya Vladimirovna Telpukhova

Publication date 23 November 2017

Full work available at URL http://www.ict.nsc.ru/jct/annotation/1723?l=eng

zbMATH Keywords

fault-tolerancecombinational circuitsensitivity factorgate observability

Mathematics Subject Classification ID

Analytic circuit theory (94C05)

Recommendations

• Methods of testability analysis for digital logic
• Fault security analysis of CMOS VLSI circuits using defect-injectable VHDL models
• scientific article; zbMATH DE number 1844672
• Design, analysis and test of logic circuits under uncertainty
• Fault diagnosis in reversible circuits under missing-gate fault model

This page was built for publication: The development of technology-independent metrics for evaluation of the masking properties of logic

Report a bug (only for logged in users!)Click here to report a bug for this page (MaRDI item Q4594422)