Critical dimension in profile semiparametric estimation
From MaRDI portal
Publication:489169
DOI10.1214/14-EJS982zbMath1308.62031arXiv1303.4640MaRDI QIDQ489169
Andreas Andresen, Vladimir Spokoiny
Publication date: 27 January 2015
Published in: Electronic Journal of Statistics (Search for Journal in Brave)
Full work available at URL: https://arxiv.org/abs/1303.4640
Estimation in multivariate analysis (62H12) Parametric tolerance and confidence regions (62F25) Nonparametric estimation (62G05) Point estimation (62F10) Generalized linear models (logistic models) (62J12)
Related Items
Nonasymptotic approach to Bayesian semiparametric inference, Finite sample behavior of a sieve profile estimator in the single index mode, On accuracy of Gaussian approximation in Bayesian semiparametric problems, Critical dimension in profile semiparametric estimation, Chernoff index for Cox test of separate parametric families
Cites Work
- Unnamed Item
- The Bernstein-von Mises theorem for the proportional hazard model
- Properties of the posterior distribution of a regression model based on Gaussian random fields
- Critical dimension in profile semiparametric estimation
- A high-dimensional Wilks phenomenon
- Parametric estimation. Finite sample theory
- Profile likelihood inferences on semiparametric varying-coefficient partially linear models
- Finite sample behavior of a sieve profile estimator in the single index mode
- Asymptotic behavior of M-estimators of p regression parameters when \(p^ 2/n\) is large. I. Consistency
- Asymptotic behavior of M estimators of p regression parameters when \(p^ 2/n\) is large. II: Normal approximation
- Asymptotic behavior of the empiric distribution of M-estimated residuals from a regression model with many parameters
- Asymptotics with increasing dimension for robust regression with applications to the bootstrap
- Semiparametric least squares (SLS) and weighted SLS estimation of single-index models
- Asymptotic normality of posterior distributions in high-dimensional linear models
- Observed information in semi-parametric models
- Convergence rates and asymptotic normality for series estimators
- Asymptotic normality of posterior distributions for exponential families when the number of parameters tends to infinity.
- Generalized likelihood ratio statistics and Wilks phenomenon
- Weak convergence and empirical processes. With applications to statistics
- Empirical process of residuals for high-dimensional linear models
- Optimal smoothing in single-index models
- Bootstrap and wild bootstrap for high dimensional linear models
- Local quantile regression
- Sieve likelihood ratio inference on general parameter space
- Introduction to empirical processes and semiparametric inference
- On Profile Likelihood
- The Large-Sample Distribution of the Likelihood Ratio for Testing Composite Hypotheses
- The Accuracy of the Gaussian Approximation to the Sum of Independent Variates
- The bootstrap and Edgeworth expansion