Biclustering scatter plots using data depth measures

DOI10.1002/SAM.11166OpenAlexW2145050767MaRDI QIDQ4969885

Xinping Cui, James Borneman, Daniel R. Jeske, Zhanpan Zhang

Publication date: 14 October 2020

Published in: Statistical Analysis and Data Mining: The ASA Data Science Journal (Search for Journal in Brave)

Full work available at URL: https://doi.org/10.1002/sam.11166

zbMATH Keywords

data depthbiclusteringquality indexscatter plotheat map

Mathematics Subject Classification ID

Statistics (62-XX) Computer science (68-XX)

Uses Software

• Silhouettes
• PSI-BLAST
• BLAST

Cites Work

• On a notion of data depth based on random simplices
• Silhouettes: a graphical aid to the interpretation and validation of cluster analysis
• On the limiting distributions of multivariate depth-based rank sum statistics and related tests
• Biclustering in data mining
• A Quality Index Based on Data Depth and Multivariate Rank Tests
• Two-mode clustering methods: astructuredoverview
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