Analytical validation of the Young-Dupré law for epitaxially-strained thin films
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Publication:4973274
DOI10.1142/S0218202519500441zbMATH Open1427.74115arXiv1809.09991OpenAlexW2972587745WikidataQ114847103 ScholiaQ114847103MaRDI QIDQ4973274FDOQ4973274
Authors: Elisa Davoli, Paolo Piovano 
Publication date: 3 December 2019
Published in: M\(^3\)AS. Mathematical Models \& Methods in Applied Sciences (Search for Journal in Brave)
Abstract: We present here an analysis of the regularity of minimizers of a variational model for epitaxially strained thin-films identified by the authors in the companion paper [Davoli E., Piovano P., Derivation of a heteroepitaxial thin-film model. Submitted 2018]. The regularity of energetically-optimal film profiles is studied by extending previous methods and by developing new ideas based on transmission problems. The achieved regularity results relate to both the Stranski-Krastanow and the Volmer-Weber modes, the possibility of different elastic properties between the film and the substrate, and the presence of the surface tensions of all three involved interfaces: film/gas, substrate/gas, and film/substrate. Finally, geometrical conditions are provided for the optimal wetting angle, i.e., the angle formed at the contact point of films with the substrate. In particular, the Young-Dupr'e law is shown to hold, yielding what appears to be the first analytical validation of such law for a thin-film model in the context of Continuum Mechanics.
Full work available at URL: https://arxiv.org/abs/1809.09991
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Cited In (12)
- Area quasi-minimizing partitions with a graphical constraint: relaxation and two-dimensional partial regularity
- Microscopical justification of solid-state wetting and dewetting
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