Mass-conserved morphological evolution of hypocycloid cavities: a model of diffusive crack initiation with no associated energy barrier
DOI10.1098/RSPA.1995.0028zbMATH Open0870.73054OpenAlexW2123384442MaRDI QIDQ4833902FDOQ4833902
Authors: Huajian Gao
Publication date: 22 September 1997
Published in: Proceedings of the Royal Society of London. Series A: Mathematical and Physical Sciences (Search for Journal in Brave)
Full work available at URL: https://doi.org/10.1098/rspa.1995.0028
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Cited In (8)
- STRESS DRIVEN INTERFACE DYNAMICS: THE EFFECTS OF SURFACE STRESS
- The effect of surface stress on the configurational equilibrium of voids and cracks
- Evolution of material voids for highly anisotropic surface energy
- A finite element analysis of the motion and evolution of voids due to strain and electromigration induced surface diffusion
- Material voids in elastic solids with anisotropic surface energies
- Hypocycloidal inclusions in nonuniform out-of-plane elasticity: stress singularity vs. stress reduction
- Analytical validation of the Young-Dupré law for epitaxially-strained thin films
- Derivation of a heteroepitaxial thin-film model
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