Localization and test exponents for tight closure

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Publication:5954564

DOI10.1307/MMJ/1030132721zbMATH Open0993.13003arXivmath/0211173OpenAlexW1985744288MaRDI QIDQ5954564FDOQ5954564


Authors: Melvin Hochster, Craig Huneke Edit this on Wikidata


Publication date: 4 February 2002

Published in: Michigan Mathematical Journal (Search for Journal in Brave)

Abstract: In this paper we study various equivalent conditions for tight closure to commute with localization. If N is a submodule of a finitely generated module M over a Noetherian commutative ring of characteristic p, then a test exponent for c,N,M is defined to be a power q' of p such that u is in the tight closure of N in M whenever cu^q is in the qth Frobenius power of N for some q ge q'. We prove that that a test exponent for a locally stable test element c and for N,M as above exists if and only if the tight closure of N in M commutes with localization. Other equivalent conditions are given for tight closure to commute with localization.


Full work available at URL: https://arxiv.org/abs/math/0211173




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