Test exponents for modules with finite phantom projective dimension
The authors exhibit a new proof of a theorem of \textit{R. Y. Sharp} [Mich. Math. J. 54, No. 2, 307--317 (2006; Zbl 1116.13004)] which states: For an equidimensional excellent local ring of characteristic \(p\) and an element \(c\) of \(R\) not in the union of minimal primes, there exists a test exponent for \(c\) and all parameter ideals. The new proof utilizes colon capturing and the Artinian property of the top local cohomology module of \(R\) with respect to the maximal ideal. They further prove that if \(R\) is additionally either Cohen Macaulay or of dimension at most two then there is a test exponent for \(c\) and all \(R\)-modules \(M\) of finite length and finite phantom projective dimension.
- Tight closure test exponents for certain parameter ideals
- Test Elements in Excellent Rings with an Application to the Uniform Artin- Rees Property
- A sufficient condition for the finiteness of Frobenius test exponents
- Frobenius test exponents for parameter ideals in generalized Cohen-Macaulay local rings
- Notes on the Frobenius test exponents
- F-rational rings have rational singularities
- F-Regularity, Test Elements, and Smooth Base Change
- Finite Phantom Projective Dimension
- Localization and test exponents for tight closure
- Localization of tight closure and modules of finite phantom projective dimension.
- Tight closure test exponents for certain parameter ideals
- Tight Closure, Invariant Theory, and the Briancon-Skoda Theorem
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