Tight closure test exponents for certain parameter ideals

DOI10.1307/MMJ/1156345596zbMATH Open1116.13004arXivmath/0508214OpenAlexW2592938177MaRDI QIDQ874431FDOQ874431

Authors: R. Y. Sharp 

Publication date: 5 April 2007

Published in: Michigan Mathematical Journal (Search for Journal in Brave)

Abstract: This paper is concerned with the tight closure of an ideal $I$ in a commutative Noetherian ring $R$ of prime characteristic $p$. The formal definition requires, on the face of things, an infinite number of checks to determine whether or not an element of $R$ belongs to the tight closure of $I$. The situation in this respect is much improved by Hochster's and Huneke's test elements for tight closure, which exist when $R$ is a reduced algebra of finite type over an excellent local ring of characteristic $p$. More recently, Hochster and Huneke have introduced the concept of test exponent for tight closure: existence of these test exponents would mean that one would have to perform just one single check to determine whether or not an element of $R$ belongs to the tight closure of $I$. However, to quote Hochster and Huneke, 'it is not at all clear whether to expect test exponents to exist; roughly speaking, test exponents exist if and only if tight closure commutes with localization'. The main purpose of this paper is to provide a short direct proof that test exponents exist for parameter ideals in a reduced excellent equidimensional local ring of characteristic $p$.

Full work available at URL: https://arxiv.org/abs/math/0508214

Recommendations

• Localization and test exponents for tight closure
• Relative test elements for tight closure
• Big tight closure test elements for some non-reduced excellent rings
• Test Ideals in Local Rings
• Test ideals and base change problems in tight closure theory

Mathematics Subject Classification ID

Characteristic (p) methods (Frobenius endomorphism) and reduction to characteristic (p); tight closure (13A35) Excellent rings (13F40)

Cites Work

• Title not available (Why is that?)
• Title not available (Why is that?)
• Title not available (Why is that?)
• Tight closure of parameter ideals
• F-modules: applications to local cohomology and D-modules in characteristic p>0.
• Tight Closure, Invariant Theory, and the Briancon-Skoda Theorem
• F-Regularity, Test Elements, and Smooth Base Change
• Local cohomological dimension in characteristic p
• Title not available (Why is that?)
• Localization of tight closure and modules of finite phantom projective dimension.
• Localization and test exponents for tight closure
• Uniform behaviour of the Frobenius closures of ideals generated by regular sequences

Cited In (16)

• A Buchsbaum theory for tight closure
• \(F\)-nilpotent rings and permanence properties
• Bounds for test exponents
• Big tight closure test elements for some non-reduced excellent rings
• When is tight closure determined by the test ideal?
• Frobenius test exponents for parameter ideals in generalized Cohen-Macaulay local rings
• Generalized F -depth and graded nilpotent singularities
• Right and left modules over the Frobenius skew polynomial ring in the \(F\)-finite case
• Counting geometric branches via the Frobenius map and \(F\)-nilpotent singularities
• Rees algebras and generalized depth‐like conditions in prime characteristic
• Test exponents for modules with finite phantom projective dimension
• Graded annihilators and tight closure test ideals
• AN INEQUALITY INVOLVING TIGHT CLOSURE AND PARAMETER IDEALS
• Localization and test exponents for tight closure
• On the Hartshorne–Speiser–Lyubeznik theorem about Artinian modules with a Frobenius action
• Test ideals and base change problems in tight closure theory

This page was built for publication: Tight closure test exponents for certain parameter ideals

Report a bug (only for logged in users!)Click here to report a bug for this page (MaRDI item Q874431)