Tight closure test exponents for certain parameter ideals

DOI10.1307/mmj/1156345596zbMath1116.13004arXivmath/0508214OpenAlexW2592938177MaRDI QIDQ874431

Rodney Y. Sharp

Publication date: 5 April 2007

Published in: Michigan Mathematical Journal (Search for Journal in Brave)

Full work available at URL: https://arxiv.org/abs/math/0508214

Mathematics Subject Classification ID

Characteristic (p) methods (Frobenius endomorphism) and reduction to characteristic (p); tight closure (13A35) Excellent rings (13F40)

Related Items (7)

A Buchsbaum theory for tight closure ⋮ Frobenius test exponents for parameter ideals in generalized Cohen-Macaulay local rings ⋮ \(F\)-nilpotent rings and permanence properties ⋮ Rees algebras and generalized depth‐like conditions in prime characteristic ⋮ Test exponents for modules with finite phantom projective dimension ⋮ Right and left modules over the Frobenius skew polynomial ring in theF-finite case ⋮ On the Hartshorne–Speiser–Lyubeznik theorem about Artinian modules with a Frobenius action

Cites Work

• Local cohomological dimension in characteristic p
• Tight closure of parameter ideals
• Uniform behaviour of the Frobenius closures of ideals generated by regular sequences
• Tight Closure, Invariant Theory, and the Briancon-Skoda Theorem
• Localization of tight closure and modules of finite phantom projective dimension.
• F-Regularity, Test Elements, and Smooth Base Change
• F-modules: applications to local cohomology and D-modules in characteristic p>0.
• Localization and test exponents for tight closure
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