Optimization of the accelerated degradation test plan for electrical connector contact pairs based on a nonlinear Wiener process
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Publication:779544
DOI10.1155/2020/5828374zbMATH Open1459.62195OpenAlexW3037692664MaRDI QIDQ779544FDOQ779544
Wen-Hua Chen, Yongwang Qian, Huajun Yao, Ping Qian, Zhe Wang, Lei Hong
Publication date: 13 July 2020
Published in: Mathematical Problems in Engineering (Search for Journal in Brave)
Full work available at URL: https://doi.org/10.1155/2020/5828374
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Cites Work
- Accelerated Testing
- Estimating degradation by a Wiener diffusion process subject to measurement error
- Bayesian methods for a growth-curve degradation model with repeated measures
- Inference from accelerated degradation and failure data based on Gaussian process models
- A pseudo-likelihood estimation method for nonhomogeneous gamma process model with random effects
- Optimal design of accelerated degradation tests based on Wiener process models
Cited In (2)
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