Optimization of the accelerated degradation test plan for electrical connector contact pairs based on a nonlinear Wiener process
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Publication:779544
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Cites work
- A pseudo-likelihood estimation method for nonhomogeneous gamma process model with random effects
- Accelerated Testing
- Bayesian methods for a growth-curve degradation model with repeated measures
- Estimating degradation by a Wiener diffusion process subject to measurement error
- Inference from accelerated degradation and failure data based on Gaussian process models
- Optimal design of accelerated degradation tests based on Wiener process models
Cited in
(5)- Optimal design of accelerated degradation test based on the combination forecast method for products with uncertain degradation models
- Reliability evaluation approach based on degradation data distribution under accelerated stresses
- Optimal constant-stress accelerated degradation test plans using nonlinear generalized Wiener process
- Multi-objective optimization design of accelerated degradation test based on Wiener process
- Optimization of product life test and degradation test under cost constraints
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