Optimization of the accelerated degradation test plan for electrical connector contact pairs based on a nonlinear Wiener process

DOI10.1155/2020/5828374zbMath1459.62195OpenAlexW3037692664MaRDI QIDQ779544

Yongwang Qian, Huajun Yao, Ping Qian, Zhe Wang, Lei Hong, Wen-Hua Chen

Publication date: 13 July 2020

Published in: Mathematical Problems in Engineering (Search for Journal in Brave)

Full work available at URL: https://doi.org/10.1155/2020/5828374

Mathematics Subject Classification ID

Nonparametric estimation (62G05) Reliability and life testing (62N05)

Cites Work

• Unnamed Item
• Inference from accelerated degradation and failure data based on Gaussian process models
• Estimating degradation by a Wiener diffusion process subject to measurement error
• Accelerated Testing
• Optimal design of accelerated degradation tests based on Wiener process models
• Bayesian methods for a growth-curve degradation model with repeated measures

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