Design of exclusive or sum-of-products (ESP) logic arrays with universal tests for detecting stuck-at and bridging faults

DOI10.1016/0045-7906(84)90018-1MaRDI QIDQ792959zbMATH OpenOpenAlexFDO

Authors Bhargab B. Bhattacharya, Bidyut Gupta, Satyabrata Sarkar, A. K. Choudhury

Publication date 1984

Published in Computers and Electrical Engineering (Search for Journal in Brave)

Full work available at URL https://doi.org/10.1016/0045-7906(84)90018-1

zbMATH Keywords

fault detectionbridging faultsAND-EXOR arraysstuck-at fault

Mathematics Subject Classification ID

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Cited in

(1)

• Testable design of two-dimensional cellular logic arrays for detecting struck-at and bridging faults

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