Design of exclusive or sum-of-products (ESP) logic arrays with universal tests for detecting stuck-at and bridging faults

DOI10.1016/0045-7906(84)90018-1zbMATH Open0537.94035OpenAlexW2020652578MaRDI QIDQ792959FDOQ792959

Authors: Bhargab B. Bhattacharya, Bidyut Gupta, Satyabrata Sarkar, A. K. Choudhury 

Publication date: 1984

Published in: Computers and Electrical Engineering (Search for Journal in Brave)

Full work available at URL: https://doi.org/10.1016/0045-7906(84)90018-1

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zbMATH Keywords

fault detectionbridging faultsAND-EXOR arraysstuck-at fault

Mathematics Subject Classification ID

Cited In (1)

• Testable design of two-dimensional cellular logic arrays for detecting struck-at and bridging faults

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