Van der Pol type self-excited micro-cantilever probe of atomic force microscopy
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Cites work
Cited in
(14)- Degenerate discontinuity-induced bifurcations in tapping-mode atomic-force microscopy
- Review of applications of self‐excited oscillations to highly sensitive vibrational sensors
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- Axial-delayed control of nonlinear resonance of nanobeams with graphene sensor
- Inner-paddled microcantilever for multi-modal and nonlinear atomic force microscopy
- Sliding onset of nanoclusters: a new AFM-based approach
- Modes of vibration, stability and internal resonances on non-linear piezoelectric small-scale beams
- Amplitude control of self-excited weakly coupled cantilevers for mass sensing using nonlinear velocity feedback control
- Modeling and design of direct nonlinear velocity feedback for modal self-excitation in a class of multi degrees-of-freedom mechanical systems
- Primary resonance of coupled cantilevers subjected to magnetic interaction
- Adaptive control of atomic force microscope for surface-profile estimation
- Axial control for nonlinear resonances of electrostatically actuated nanobeam with graphene sensor
- Dynamics of hysteretic-related Van-der-Pol oscillators: the small parameter method
- A generalized van der Pol type oscillator: investigation of the properties of its limit cycle
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