SEC-DED
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Software:15740
swMATH3207MaRDI QIDQ15740FDOQ15740
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Cited In (16)
- Measurement and Generation of Error Correcting Codes for Package Failures
- On Generating the N-ary Reflected Gray Codes
- Single Byte Error Correcting—Double Byte Error Detecting Codes for Memory Systems
- SEC-BED-DED Codes for Error Control in Byte-Organized Memory Systems
- Implementation of an Experimental Fault-Tolerant Memory System
- A Class of Odd-Weight-Column SEC-DED-SbED Codes for Memory System Applications
- Title not available (Why is that?)
- A class of error-locating codes for byte-organized memory systems
- SEC-DED Nonbinary Code for Fault-Tolerant Byte-Organized Memory Implemented with Quaternary Logic
- A Class of Linear Codes for Error Control in Byte-per-Card Organized Digital Systems
- Erasure and Error Decoding for Semiconductor Memories
- Binary set functions and parity check matrices
- A Self-Checking Generalized Prediction Checker and Its Use for Built-In Testing
- A Construction Method of High-Speed Decoders Using ROM's for Bose–Chaudhuri–Hocquenghem and Reed–Solomon Codes
- Linear sum codes for random access memories
- On-line testing for VLSI: state of the art and trends
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