Entity usage

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This page lists pages that use the given entity (e.g. Q42). The list is sorted by descending page ID, so that newer pages are listed first.

List of pages that use a given entity

Showing below up to 21 results in range #1 to #21.

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  1. Interval and point estimators for the location parameter of the three-parameter lognormal distribution: Label: en
  2. Study on POSBIST systems: Label: en
  3. A family of lifetime distributions: Label: en
  4. Uniqueness of maximum likelihood estimators for a backup system in a condition-based maintenance: Label: en
  5. On Bayesian analysis of Burr type VII distribution under different censoring schemes: Label: en
  6. Parameter estimation based on the Fréchet progressive type II censored data with binomial removals: Label: en
  7. Estimation of reliability for a two component survival stress-strength model: Label: en
  8. Estimation of failure probability and its applications in lifetime data analysis: Label: en
  9. Probabilistic modeling of fatigue damage accumulation for reliability prediction: Label: en
  10. Bayesian prediction of the overhaul effect on a repairable system with bounded failure intensity: Label: en
  11. On three competing maintenance actions and the related condition control: Label: en
  12. Bayes estimation of a two-parameter geometric distribution under multiply type II censoring: Label: en
  13. A confidence region for zero-gradient solutions for robust parameter design experiments: Label: en
  14. Bayes estimation of change point in discrete Maxwell distribution: Label: en
  15. Bayes estimation of two-phase linear regression model: Label: en
  16. Power loss of stratified log-rank test in homogeneous samples: Label: en
  17. About statistical analysis of qualitative survey data: Label: en
  18. Process monitoring with multivariate \(p\)-control chart: Label: en
  19. Tolerance intervals in a heteroscedastic linear regression context with applications to aerospace equipment surveillance: Label: en
  20. A unified approach for predicting long- and short-term capability indices with dependence on manufacturing target bias: Label: en
  21. Sensitivity analysis to select the most influential risk factors in a logistic regression model: Label: en

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