Pages that link to "Item:Q2964964"

The following pages link to Dynamic Anti-plane Crack Analysis in Functional Graded Piezoelectric Semiconductor Crystals (Q2964964):

Displaying 11 items.

• Stress-induced electric potential barriers in thickness-stretch deformations of a piezoelectric semiconductor plate (Q823929) (← links)
• Singularity analysis of planar cracks in three-dimensional piezoelectric semiconductors via extended displacement discontinuity boundary integral equation method (Q1655061) (← links)
• Iterative boundary element method for crack analysis of two-dimensional piezoelectric semiconductor (Q1655978) (← links)
• An efficient iteration approach for nonlinear boundary value problems in 2D piezoelectric semiconductors (Q1985015) (← links)
• Electromechanical interactions in a composite plate with piezoelectric dielectric and nonpiezoelectric semiconductor layers (Q2083796) (← links)
• Stress effects on electric currents in antiplane problems of piezoelectric semiconductors over a rectangular domain (Q2132717) (← links)
• Interaction between bending and mobile charges in a piezoelectric semiconductor bimorph (Q2164513) (← links)
• Extension of a piezoelectric semiconductor fiber with consideration of electrical nonlinearity (Q2296369) (← links)
• Effects of an attached functionally graded layer on the electromechanical behaviors of piezoelectric semiconductor fibers (Q2689964) (← links)
• The adjustment of electro-elastic properties in non-uniform flexoelectric semiconductor nanofibers (Q2694644) (← links)
• Electromechanical field analysis of PN junctions in bent composite piezoelectric semiconductor beams under shear forces (Q6490818) (← links)