Pages that link to "Item:Q425684"

The following pages link to Optimal acceptance sampling plans for log-location-scale lifetime models using average risks (Q425684):

Displaying 14 items.

• Optimum attributes component test plans for \(k\)-out-of-\(n:F\) Weibull systems using prior information (Q300038) (← links)
• Generalized beta prior models on fraction defective in reliability test planning (Q421820) (← links)
• Computation of optimum reliability acceptance sampling plans in presence of hybrid censoring (Q1623776) (← links)
• Economic lot sampling inspection from defect counts with minimum conditional value-at-risk (Q1751676) (← links)
• Minimizing the area of a Pareto confidence region (Q1926837) (← links)
• Computing tolerance limits for the lifetime of a \(k\)-out-of-\(n\):\(F\) system based on prior information and censored data (Q1991364) (← links)
• Efficient truncated repetitive lot inspection using Poisson defect counts and prior information (Q2023984) (← links)
• Computing optimal confidence sets for Pareto models under progressive censoring (Q2252204) (← links)
• Classical versus Bayesian risks in acceptance sampling: a sensitivity analysis (Q2255932) (← links)
• Explicit quasi-optimal inspection schemes from nonconformity count data with controlled producer and consumer risks (Q2281815) (← links)
• Controlling posterior producer and consumer risks in lot reinspection (Q2281834) (← links)
• Optimal lot disposition from Poisson-Lindley count data (Q2310620) (← links)
• Optimal random sample size in progressively Type-II censoring based on cost constraint for the proportional hazards family (Q3389662) (← links)
• Optimal design of multivariate acceptance sampling plans by variables (Q5040527) (← links)