Test generation and coverage metrics

MaRDI QIDQ3574325zbMATH OpenFDO

Authors Ernesto Sánchez, Giovanni Squillero, Matteo Sonza Reorda

Publication date 9 July 2010

zbMATH Keywords

digital circuits

Mathematics Subject Classification ID

Reliability, testing and fault tolerance of networks and computer systems (68M15)

Recommendations

• scientific article; zbMATH DE number 1751921
• Functional Level Primitives in Test Generation
• High-level test synthesis: a survey
• Development of tests for VLSI circuit testability at the upper design levels
• scientific article; zbMATH DE number 1693444

Cited in

(1)

• Test generation for processing control

This page was built for publication: Test generation and coverage metrics

Report a bug (only for logged in users!)Click here to report a bug for this page (MaRDI item Q3574325)