Functional Level Primitives in Test Generation
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complex sequential circuitsfault detectionfault diagnosisfunctional level modelingfunctional test generationtest sequences
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Cited in
(15)- Functional test generation using binary decision diagrams
- Structural approach to functional faults testing in discrete devices
- scientific article; zbMATH DE number 1703873 (Why is no real title available?)
- Test generation and coverage metrics
- Functional test generation based on combined random and deterministic search methods
- Mathematical principles of boundary scan test generation
- Sequential test generators: past, present and future
- High-level synthesis techniques for functional test pattern execution
- FsmTest: Functional test generation for sequential circuits
- scientific article; zbMATH DE number 1941184 (Why is no real title available?)
- Test generation with dynamic probe points in high observability testing environment
- scientific article; zbMATH DE number 1751921 (Why is no real title available?)
- scientific article; zbMATH DE number 2204028 (Why is no real title available?)
- Test pattern generator for NMOS integrated circuits
- A generalized fault simulator for combinational logic circuits
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