FsmTest: Functional test generation for sequential circuits

DOI10.1016/0167-9260(96)00006-5MaRDI QIDQ4332021zbMATH OpenOpenAlexDBLPWikidataFDO

Authors G. Buonanno, Franco Fummi, Donatella Sciuto, Fabrizio Lombardi

Publication date 27 February 1997

Published in Integration (Search for Journal in Brave)

Full work available at URL https://doi.org/10.1016/0167-9260(96)00006-5

zbMATH Keywords

Distinguishing sequencesFunctional testingTest pattern generation

Mathematics Subject Classification ID

Computer system organization (68M99)

Recommendations

• Structural approach to functional faults testing in discrete devices
• Functional Level Primitives in Test Generation
• Sequential test generators: past, present and future
• The test generation of digital sequental circuits with the multiple observation time strategy
• A New and Fast Approach to Very Large Scale Integrated Sequential Circuit Test Generation

Cited in

(7)

• Synthesis of finite state machines for improved state verification
• Structural approach to functional faults testing in discrete devices
• FSM Test Translation Through Context
• Functional test generation based on combined random and deterministic search methods
• A complete testing strategy based on interacting and hierarchical FSMs
• The test generation of digital sequental circuits with the multiple observation time strategy
• Test pattern generator for NMOS integrated circuits

This page was built for publication: FsmTest: Functional test generation for sequential circuits

Report a bug (only for logged in users!)Click here to report a bug for this page (MaRDI item Q4332021)