Sequential test generators: past, present and future

DOI10.1016/S0167-9260(98)00020-0MaRDI QIDQ4225362zbMATH OpenFDO

Authors Yong Chang Kim, K. K. Saluja

Publication date 12 January 1999

Published in Integration (Search for Journal in Brave)

Full work available at URL https://doi.org/10.1016/S0167-9260(98)00020-0

zbMATH Keywords

automatic test pattern generationsequential circuit test generationstructure-based testingtest generation algorithms

Mathematics Subject Classification ID

Hardware implementations of nonnumerical algorithms (VLSI algorithms, etc.) (68W35)

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Cited in

(12)

• A parallel system for test pattern generation
• Test generation of the digital circuits based on the genetic algorithms
• scientific article; zbMATH DE number 4033096 (Why is no real title available?)
• On-line testing for VLSI: state of the art and trends
• FsmTest: Functional test generation for sequential circuits
• A New and Fast Approach to Very Large Scale Integrated Sequential Circuit Test Generation
• Producing reliable initialization and test of sequential circuits with pseudorandom vectors
• scientific article; zbMATH DE number 2063044 (Why is no real title available?)
• scientific article; zbMATH DE number 1909483 (Why is no real title available?)
• The test generation of digital sequental circuits with the multiple observation time strategy
• Test pattern generator for NMOS integrated circuits
• Forecasting the efficiency of test generation algorithms for combinational circuits

Describes a project that uses

Uses Software

• HITEC

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