Test pattern generator for NMOS integrated circuits

MaRDI QIDQ5323335zbMATH OpenFDO

Authors Carles Ferrer Ramis, Jean-Pierre Deschamps, Joan Oliver Malagelada, Jordi Carrabina Bordoll, Elena Valderrama Vallés

Publication date 23 July 2009

Full work available at URL https://eudml.org/doc/40079, http://www.idescat.cat/sort/questiio/questiiopdf/11.2.5.ferrer.pdf

zbMATH Keywords

fault detectionnon-oriented graphsATPGD-algorithmswitch-level

Mathematics Subject Classification ID

Fault detection; testing in circuits and networks (94C12)

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