Structural approach to functional faults testing in discrete devices
A new test generation method of functional single-state transition faults for sequential discrete devices on the gate description level is suggested. Proposed method is based on application of symbolic simulation algorithm of single-state transition faults. Universal 16-valued alphabet and characteristic multivalued functions are applied. Given approach allows generate tests for functional single-state transition faults on the gate description level and combines advantages of finite state machine and structural methods of diagnostic experiments generation for sequential devices.
- The parallel simulation of functional single-state-transition faults
- FsmTest: Functional test generation for sequential circuits
- Functional Level Primitives in Test Generation
- The test generation of digital sequental circuits with the multiple observation time strategy
- scientific article; zbMATH DE number 47895
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