Structural approach to functional faults testing in discrete devices

MaRDI QIDQ2720921zbMATH OpenFDO

Authors R. I. Sadimak, Vadim Y. Skobtsov

Publication date 2 July 2001

Published in Trudy Instituta Prikladnoĭ Matematiki i Mekhaniki (Search for Journal in Brave)

zbMATH Keywords

functional single-state transition faultsequential discrete devicessymbolic simulationtest generation

Mathematics Subject Classification ID

Reliability, testing and fault tolerance of networks and computer systems (68M15) Fault detection; testing in circuits and networks (94C12)

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• scientific article; zbMATH DE number 47895

Cited in

(9)

• Method for segregation of suspected logical malfunctions in combinatorial discrete devices
• Path testing in circuits with functional units
• Functional testing based on unified structural redundancy
• Functional test generation based on combined random and deterministic search methods
• Decomposition of discrete devices for testable transformation
• FsmTest: Functional test generation for sequential circuits
• New Design for Testability Approach for Clock Fault Testing
• Development of a multiple intermittent fault testing strategy
• Design of easily testable discrete devices: Ideas, methods, implementation

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