The parallel simulation of functional single-state-transition faults

MaRDI QIDQ2735900zbMATH OpenFDO

Authors D. E. Ivanov

Publication date 10 October 2001

Published in Trudy Instituta Prikladnoĭ Matematiki i Mekhaniki (Search for Journal in Brave)

zbMATH Keywords

fault simulationfinite state machinesequential digital devicesingle-state-transition fault

Mathematics Subject Classification ID

Reliability, testing and fault tolerance of networks and computer systems (68M15) Fault detection; testing in circuits and networks (94C12)

Review text

The problem of fault simulation for sequential digital devices is considered. New parallel simulation method of functional single-state-transition faults for finite state machine on gate level description is proposed. The simulation is realized in the multivalued alphabet that is a subset of the universal 16-valued alphabet \(B_{16}\). Using functional single-state-transition fault model allows to reduce a number of simulated faults and consequently allows essentially to reduce simulation time in comparison with methods utilizing the stuck-at fault model. Also single-state-transition fault model allows to increase an accuracy of the fault coverage estimation.

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Cited in

(9)

• Structural approach to functional faults testing in discrete devices
• Fault simulation in multivalued alphabets
• Concurrent analogue fault simulation, the equation formulation aspect
• Serial diagnostic fault simulation for synchronous sequential circuits
• Parallel fault simulation on a multiprocessor
• On fault simulation for synchronous sequential circuits
• A gate-level simulation environment for alpha-particle-induced transient faults
• Localizing Faults in Simulink/Stateflow Models with STL
• Fast deterministic simulation of computations on faulty parallel machines

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