Testability Conditions for Bilateral Arrays of Combinational Cells

DOI10.1109/TC.1986.1676653MaRDI QIDQ3695201zbMATH OpenFDO

Authors Anastasios Vergis, Ken Steiglitz

Publication date 1986

Published in IEEE Transactions on Computers (Search for Journal in Brave)

Full work available at URL https://doi.org/10.1109/TC.1986.1676653

zbMATH Keywords

fault detectionlinear growthone-step testabilitypreset test sequencesquadratic growthsystolic array

Mathematics Subject Classification ID

Cellular automata (computational aspects) (68Q80)

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Cited in

(3)

• On GID-testable two-dimensional iterative arrays
• A testable design of iterative logic arrays
• Some remarks on the test complexity of iterative logic arrays (extended abstract)

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