The Design of Easily Testable VLSI Array Multipliers

DOI10.1109/TC.1984.1676480MaRDI QIDQ3321987zbMATH OpenOpenAlexFDO

Authors John P. Shen, F. Joel Ferguson

Publication date 1984

Published in IEEE Transactions on Computers (Search for Journal in Brave)

Full work available at URL https://doi.org/10.1109/tc.1984.1676480

zbMATH Keywords

array multipliersC-testabilityexhaustive testingVLSI testing

Mathematics Subject Classification ID

Cited in

(2)

• Testing in two-dimensional iterative logic arrays
• scientific article; zbMATH DE number 3890726 (Why is no real title available?)

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