Tight closure test exponents for certain parameter ideals

DOI10.1307/MMJ/1156345596MaRDI QIDQ874431zbMATH OpenOpenAlexFDO

Authors R. Y. Sharp

Publication date 5 April 2007

Published in Michigan Mathematical Journal (Search for Journal in Brave)

Full work available at URL https://arxiv.org/abs/math/0508214

Mathematics Subject Classification ID

Characteristic (p) methods (Frobenius endomorphism) and reduction to characteristic (p); tight closure (13A35) Excellent rings (13F40)

Abstract: This paper is concerned with the tight closure of an ideal $I$ in a commutative Noetherian ring $R$ of prime characteristic $p$. The formal definition requires, on the face of things, an infinite number of checks to determine whether or not an element of $R$ belongs to the tight closure of $I$. The situation in this respect is much improved by Hochster's and Huneke's test elements for tight closure, which exist when $R$ is a reduced algebra of finite type over an excellent local ring of characteristic $p$. More recently, Hochster and Huneke have introduced the concept of test exponent for tight closure: existence of these test exponents would mean that one would have to perform just one single check to determine whether or not an element of $R$ belongs to the tight closure of $I$. However, to quote Hochster and Huneke, 'it is not at all clear whether to expect test exponents to exist; roughly speaking, test exponents exist if and only if tight closure commutes with localization'. The main purpose of this paper is to provide a short direct proof that test exponents exist for parameter ideals in a reduced excellent equidimensional local ring of characteristic $p$.

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Cited in

(16)

• Graded annihilators and tight closure test ideals
• Test exponents for modules with finite phantom projective dimension
• Right and left modules over the Frobenius skew polynomial ring in the \(F\)-finite case
• Generalized F -depth and graded nilpotent singularities
• Big tight closure test elements for some non-reduced excellent rings
• \(F\)-nilpotent rings and permanence properties
• On the Hartshorne–Speiser–Lyubeznik theorem about Artinian modules with a Frobenius action
• Counting geometric branches via the Frobenius map and \(F\)-nilpotent singularities
• When is tight closure determined by the test ideal?
• Test ideals and base change problems in tight closure theory
• A Buchsbaum theory for tight closure
• Frobenius test exponents for parameter ideals in generalized Cohen-Macaulay local rings
• Rees algebras and generalized depth‐like conditions in prime characteristic
• Localization and test exponents for tight closure
• AN INEQUALITY INVOLVING TIGHT CLOSURE AND PARAMETER IDEALS
• Bounds for test exponents

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