Transmission eigenvalues with artificial background for explicit material index identification

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Abstract: We are interested in the problem of retrieving information on the refractive index n of a penetrable inclusion embedded in a reference medium from farfield data associated with incident plane waves. Our approach relies on the use of transmission eigenvalues (TEs) that carry information on n and that can be determined from the knowledge of the farfield operator F. In this note, we explain how to modify F into a farfield operator Fart=F−ildeF, where ildeF is computed numerically, corresponding to well chosen artificial background and for which the associated TEs provide more accessible information on n.


The authors consider a method to obtain information on the refractive index \(n\) of an inclusion embedded in a reference medium from the farfield data \(F\) of scattered plane waves (an exact a priori knowledge of the support of the inclusion is not required). It is possible to determine transmission eigenvalues (in short: TEs) from these data which contain informations on the material properties. \vskip 0.8em The determination of quantitative features from these TEs is complicated. The authors propose to work with another farfield operator \({F}^{\text{art}}:=F-\tilde{F}\) instead, where \(\tilde{F}\) corresponds to an artificial background, i.e. reference medium, and can obtained by a rather direct calculation. The determination of the refractive index based on the TEs of \({F}^{\text{art}}\) is simpler as before. \vskip 0.8em The authors present two theorems and a numerical illustration. Also the choice of other artificial backgrounds is discussed and a monotone dependence of the eigenvalues on \(n\) is shown with the aid of a \(min\)-\(max\) formula.





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